MIL-DTL-5790H
4.5.1 Individual tests. Each transmitter shall be subjected to the following:
a.
Examination of product.
(4.6.1)
b.
Scale error.
(4.6.2)
c.
Friction error.
(4.6.3)
d.
Position error (attitude).
(4.6.4)
e.
Case leakage.
(4.6.5)
f.
Dielectric strength.
(4.6.6.5)
4.5.2 Sampling plan A tests. Sampling plan A tests are in addition to the individual
tests. The manufacturer shall select the type of sampling plan (i.e. attribute, variable, or
continuous) in accordance with MIL-STD-1916. The sample size shall be selected in accordance
with verification level I of MIL-STD-1916.
a. Individual tests.
(4.5.1)
b. Electrical characteristics (as listed).
Open secondary.
(4.6.6.1)
Power consumption.
(4.6.6.2)
Secondary voltage.
(4.6.6.3)
Power supply variation.
(4.6.6.4)
c. Low temperature (operational).
(4.6.7)
d. High temperature (operational).
(4.6.8)
e. Vibration.
(4.6.9)
f. Indicator operation.
(4.6.10)
4.5.3 Sampling plan B tests. Sampling plan B tests are in addition to the individual and
sampling plan A tests. The type of sampling plan (i.e. attribute, variable, or continuous) shall be
selected by the manufacturer in accordance with MIL-STD-1916. The sample size shall be
selected in accordance with verification level I of MIL-STD-1916.
a.
Sampling plan A tests.
(4.5.2)
b.
Electrical zero.
(4.6.6.6)
c.
Torque.
(4.6.11)
d.
Low temperature (non-operational).
(4.6.12)
e.
High temperature (non-operational).
(4.6.13)
f.
Pressure-altitude.
(4.6.14)
g.
Electromagnetic interference.
(4.6.15)
h.
Overpressure.
(4.6.16)
i.
Salt fog
(4.6.17)
j.
Damping.
(4.6.18)
k.
Seasoning.
(4.6.19)
l.
Shock.
(4.6.20)
m.
Humidity.
(4.6.21)
n.
Fungus.
(4.6.22)
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